By using an advanced electron-optical system with a Schottky emitter, the EPMA-8050G microanalyzer has an unprecedentedly high spatial resolution of SEM images in a wide range of currents (up to 1 μA). Combined with high-performance X-ray spectrometers, an optical microscope, a dual digital scanning converter and a new workstation, the system allows you to achieve unsurpassed results when conducting microanalysis.
Electro-probe microanalyzer
Features
- The use of a high-performance Schottky emitter in the electron gun design made it possible to significantly narrow the beam diameter and provide ultra-high spatial resolution in the entire range of accelerating voltages.
- The image resolution in secondary electrons (3 nm at an accelerating voltage of 30 kV) is the highest among EPMA systems.
- A stable electron beam (maximum probe current of 3 μA) allows achieving high spatial resolution and sensitivity in the entire current range without the need to change the objective aperture.
- A two-stage vacuum system provides a constant high vacuum in the electron gun chamber and, accordingly, high beam stability necessary for precision microanalysis.
- The device can be equipped with high-performance 4-inch X-ray spectrometers (up to five pieces) with an X-ray beam registration angle of 52.5°.
Intuitive controls are suitable for both beginners and advanced users to perform complex analyses. - The multi-window interface allows you to work in multitasking mode and present results in the most convenient and detailed form, which increases the visibility of the results and the effect of their study.
- Does not require a large space for placement (the minimum room dimensions are 3.5 x 4.0 m).
