SolidSpec-3700/3700DUV, SolidSpec-3700i/3700i DUV

UV-Vis-NIR spectrophotometer for the study of optical materials, semiconductors and other materials

Spectrophotometers of this series are distinguished by high sensitivity, the ability to perform measurements in a wide spectral range (from deep UV to near infrared), as well as a large cuvette compartment. All the best that was achieved during the development of the UV-3600 Plus spectrophotometer was used in the spectrophotometer for special measurements SolidSpec. In addition to the high characteristics inherited from the UV-3600 Plus model, SolidSpec has a number of its own unique features. Among which it is necessary to note the ability to work in the vacuum UV range of the spectrum and a large working compartment, which can accommodate not only almost any attachment, but also large samples, including for mapping over the sample area.

The SolidSpec-3700i/3700i DUV spectrophotometers are controlled by LabSolutions UV-Vis software.                            The SolidSpec-3700/3700 ​​DUV spectrophotometers are controlled by UVProbe software.

Measurement in vacuum UV

The SolidSpec-3700i DUV/SolidSpec-3700 DUV operate in vacuum UV from 165 nm (from 175 nm with an integrating sphere) with very low stray light. The optical unit and cuvette compartment are purged with nitrogen to remove oxygen that absorbs in the region below 190 nm. The spectral range for measurements using the integrating sphere is from 175 nm to 2600 nm. An additional module for direct measurement in ultraviolet (Direct Detection Unit DUV) allows you to extend this range from 165 to 3300 nm and to perform measurements without using an integrating sphere.

Working with large samples

The large sample compartment (900mm x 700mm x 350mm) allows convenient placement of samples with a maximum size of 700mm x 560mm x 40mm. The vertical arrangement of the optical beam allows measurements of samples placed horizontally. Measurements are possible over the entire sample surface with an area of ​​310 x 310 mm2. The automatic sample movement system allows measurements to be made at a predetermined point on the sample with simultaneous nitrogen purging. A sufficient number of necessary attachments, such as the attachment of disturbed total internal reflection (TTIR), etc. significantly expand the scope of application of this spectrophotometer.

Attachments and accessories (option)

  • DDU-DUV detection unit (for solid and liquid sample analysis)
  • Precision sample movement device, can move along X-Y coordinates (for measurement automation)
  • Specific reflection measurement attachment
  • Nitrogen purification unit
  • Absolute specular reflection attachment with the ability to measure at different angles (5⁰, 12⁰, 30⁰, 45⁰)
  • Integrating spheres

Software

The standard instrument package includes UVProbe or LabSolutions UV-Vis software. Shimadzu offers special software or add-ons for solving special tasks, including software for measuring color, film thickness, measuring sunlight transmission, calculating the bandgap width of semiconductors, calculating SPF factors of sunscreens and accessories, and much more.

Technical specifications

SolidSpec-3700 and solar panels