EDX-7200

The EDX-7200 spectrometer provides high-precision quantitative and qualitative analysis of elements in the range from Na (11) to U (92) thanks to the use of an advanced silicon drift detector (SDD). Compared to previous models, the counting speed is increased by up to 30 times, which allows you to significantly reduce measurement time without losing accuracy. Thanks to the high resolution, the instrument reduces the overlap of element peaks, which increases the reliability of the results.

• Speed ​​and sensitivity: Thanks to the high-speed circuit and optimized algorithms, the instrument provides up to 30 times higher throughput compared to the EDX-720 model, and the lower detection limit of trace elements is improved by up to 6 times.
• High resolution: The new SDD detector provides excellent energy resolution, which can significantly reduce the effect of overlapping peaks of different elements and improve the accuracy of the analysis.
• Thermoelectric cooling: No liquid nitrogen is required to cool the detector, which reduces operating costs.
• Flexibility in use: The instrument supports the analysis of samples in air, vacuum or with helium purge, which is especially important for the analysis of light elements. It is also equipped with a 12-sample turret for automated measurements.
• Observation camera and collimators: Automatic switching of collimators with a diameter of 1, 3, 5 and 10 mm allows you to adapt the irradiation diameter to the size of the sample. The built-in observation camera helps to precisely identify the analysis area, which is especially useful for small or complex samples.
• Primary filters: Automatic change of five primary filters significantly improves the sensitivity of trace element detection by reducing the X-ray background.
• Sensitivity to light elements can be significantly increased by using a vacuum system or helium purge system (optional), which minimizes the influence of air and allows for more accurate element determination on samples with light components.
• The compact size of the instrument saves space, while it is equipped with a large sample chamber (300 mm x 275 mm x 100 mm) for convenient analysis of large and heavy samples.
• Easy start-up of the instrument is ensured by the functions of automatic initialization and stabilization of the X-ray tube, making the operation process more convenient and less time-consuming for users.
• Continuous measurement support can be implemented using an optional 12-position autosampler, allowing for automated analysis of large numbers of samples without the need for constant operator intervention.